Testing and Design for Testabiltiy

1. Design for testability
2. Defects, faults and errors
3. Test design and fault coverage
4. Stuck at fault model
5. Stuck open/short fault model
6. Scan Technique
7. Built-in self test
8. Testing memories
9. IC packaing
10. PCB design fabrication
11. Boundry scan and JTAG
12. Glitches and logical hazards
13. Static Hazarads
14. Dynamic Hazarads
15. Reliability of vlsi systems